In this online, asynchronous scanning electron microscopy (SEM) training course, students learn how to effectively use a scanning electron microscope for a wide range of applications. Learning material is presented in a variety of formats, including video instruction, downloadable learning resources, and quizzes. Students learn the fundamentals of scanning electron microscopy, and how to apply both qualitative and quantitative analyses to identify particles through a series of lectures and demonstrations. Enjoy your learning experience!
Session 1 - Course Introduction
Instructors Craig Schwandt and Doug Meier provides a brief introduction to the course.
Video Length - 00:03:12
Reading - Technical Terms
Session 2 - Course Outline & Objectives
Instructor Doug Meier talks about how students will be able to setup, align, and operate a scanning electron microscope and energy dispersive X-ray spectroscopy instrumentation.
Video Length - 00:26:31
Reading - A Note on Magnification
Quiz - SEM in Context
Session 3 - Instrument Basics: Vacuum
Instructor Doug Meier talks about basic scanning electron microscopy vacuum systems
Video Length - 00:09:55
Quiz - SEM Vacuum Basics
Session 4 - Instrument Basics: Emitters
Instructor Doug Meier talks about electron gun components, the emitter, and the lens system of the scanning electron microscope
Video Length - 00:31:13
Reading 1 - Probe Current Diameter and Image Quality
Reading 2 - Insufficient Filament Heating
Quiz - SEM Emitters
Session 5 - Instrument Basics: Column
Instructor Doug Meier talks about the components of the electron gun column that form and focus the electron beam.
Video Length - 00:13:33
Reading - Influence of Astigmatism
Quiz - SEM Electron Gun Column
Session 6 - Instrument Basics: Detector
Instructor Doug Meier talks about the various detectors used in a scanning electron microscope
Video Length - 00:35:35
Reading 1 - Edge Effect on Image Quality
Reading 2 - Specimen Tilt
Reading 3 - Backscatter Electron Signals
Reading 4 - Specimen Damage by Electron Beam
Reading 5 - Contamination
Reading 6 - Influence of Charging
Quiz - SEM Detectors
Session 7 - SEM Image Acquisition and Alignment
Instructor Doug Meier talks about proper alignment of electron gun, the aperture, and beam stigmation
Video Length - 00:50:47
Reading - Working Distance and Objective Aperture
Quiz - SEM Alignment
Session 8 - SEM Image Acquisition Parameters
Instructor Doug Meier talks about SEM image acquisition and optimization
Video Length - 00:49:33
Reading 1 - Contrast and Brightness
Reading 2 - Image Changes Caused by Probe Interactions
Reading 3 - Coating a Sample
Quiz - Image Acquisition Parameters
Session 9 - What are X-rays?
Instructor Craig Schwandt talks about nondestructive analysis using energy dispersive X-ray spectrometry
Video Length - 00:59:35
Reading 1 - Periodic Table for the Electron Microscopist
Reading 2 - Can I Trust My Quantitative EDS Data?
Quiz - X-Rays: Nondestructive Analysis
Session 10 - Detection and Collection of X-rays
Instructor Craig Schwandt talks about X-rays and the best way to detect and collect them.
Video Length - 00:41:39
Quiz - X-Rays: Detection Collection
Session 11 - Conducting Semi-Quantitative Microanalysis
Instructor Craig Schwandt talks about conducting semi-quantitative microanalysis using known standards
Video Length - 00:38:15
Quiz - Conducting Semi-Quantitative Microanalysis
Session 12 - Conducting Microanalysis
Instructor Craig Schwandt talks about getting the best possible microanalysis data
Video Length - 00:11:15
Quiz - Conducting Microanalysis
Session 13 - Quantitative Analysis
Instructor Craig Schwandt talks about determining the concentration of elements in a sample using weight percentages.
Video Length - 00:15:36
Quiz - Quantitative Analysis
Session 14 - Additional Quantitative Analysis Concepts
Instructor Craig Schwandt talks about the value of looking at atomic percentages.
Video Length - 00:54:00
Quiz - Additional Quantitative Analysis Concepts
Session 15 - X-ray Mapping Demonstrations at the SEM
Instructor Craig Schwandt demonstrates quantitative element mapping.
Video Length - 00:15:57
Quiz - X-Ray Mapping
Session 16 - SEM Course Summary and Final Overview
Instructors Craig Schwandt and Doug Meier provide final thoughts and wrap-up to the course.
Video Length - 00:02:30
Course Evaluation
Douglas C. Meier, Ph.D.
Senior Research Scientist, McCrone Associates
Doug currently specializes in X-ray microanalysis of particles using energy and wavelength dispersive spectrometry methods with the scanning electron microscope and electron microprobe. Doug began his career as a physical chemist and surface scientist, developing capabilities and expertise in surface-sensitive spectroscopies such as Auger electron spectroscopy, X-ray photoelectron spectroscopy, infrared reflection-absorption spectroscopy, thermal desorption spectroscopy, and low-energy electron diffraction. He later was awarded a National Research Council postdoctoral research associateship with the Process Sensing Group of the National Institute of Standards and Technology where he was able to apply these skills to the development of conductometric chemical microsensor array technology, demonstrating the ability to detect and identify chemical warfare agents, toxic industrial chemicals, and volatile organic compounds at concentrations in air lower than one part per million. For this work, Doug was awarded the U.S. Department of Commerce Silver Medal. Doug segued into standards and metrology development for microanalytical techniques such as Auger microscopy, wavelength dispersive spectrometry, and transmission electron microscopy, building ten years of microbeam analysis experience prior to joining McCrone Associates, Inc.
Ph.D., Chemistry, Texas A&M University, 2001
B.A., Chemistry, Northwestern University, 1996
https://www.mccrone.com/staff/douglas-c-meier-ph-d/
Craig S. Schwandt, Ph.D.
Director of Industrial Services and Senior Research Scientist, McCrone Associates
Craig specializes in X-ray microanalysis of particles using energy and wavelength dispersive spectrometry methods with the scanning electron microscope and electron microprobe. Craig has extensive and diverse analytical capabilities developed with extensive petrologic and mineralogical research. These include, among others topics, optical crystallography, X-ray diffraction analysis, electron microscopy, and X-ray spectrometry. He began acquiring his experience working for the Wisconsin Geological and Natural History Survey. He was the first geosciences postdoctoral appointee at Sandia National Laboratories. Subsequently, he was a national research council associate at Johnson Space Center, where he continued as a contractor support scientist with the Office of Astromaterials Research until joining McCrone Associates.
Ph.D., Geology, South Dakota School of Mines and Technology, 1991
M.S., Geology, University of Missouri - Columbia, 1988
B.S., Geology and Geophysics, University of Wisconsin - Madison, 1984
https://www.mccrone.com/staff/craig-s-schwandt-ph-d/
Here are a few comments we’ve received from students who have completed the online PLM course:
“Excellent course! Love the self-paced aspect and that you can pause videos and work through the set-up with the instructor. Love all of the examples and techniques shown. Such great information and resources.”
“The instructor is very knowledgeable about the subject and a very good teacher. ”
“I thought the concepts were explained very well and the organization and pacing of the course was perfect.”
"This course is a wonderful resource for initial training as a prerequisite for in-house Asbestos ID by PLM training."
